6Q9U
HDMX (14-111; C17S) COMPLEXED WITH COMPOUND 12 AT 2.4A; Structural states of Hdm2 and HdmX: X-ray elucidation of adaptations and binding interactions for different chemical compound classes
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2012-06-21 |
| Detector | PSI PILATUS 6M |
| Wavelength(s) | 0.99983 |
| Spacegroup name | P 41 |
| Unit cell lengths | 45.403, 45.403, 55.825 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 19.080 - 2.400 |
| R-factor | 0.2083 |
| Rwork | 0.205 |
| R-free | 0.26540 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 6q9q |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.278 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | REFMAC |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 19.080 | 2.460 |
| High resolution limit [Å] | 2.400 | 2.400 |
| Rmerge | 0.141 | 0.347 |
| Rmeas | 0.153 | 0.380 |
| Rpim | 0.087 | 0.214 |
| Number of reflections | 4485 | |
| <I/σ(I)> | 8.5 | 4 |
| Completeness [%] | 99.7 | 99.7 |
| Redundancy | 6.5 | 6.1 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 298 | 2.3M AmSO4, 2% w/v 18-crown-ether, 0.1M HEPES |
