6Q9S
HDMX (14-111; C17S) COMPLEXED WITH COMPOUND 14 AT 2.4A: Structural states of Hdm2 and HdmX: X-ray elucidation of adaptations and binding interactions for different chemical compound classes
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2010-02-25 |
| Detector | PSI PILATUS 6M |
| Wavelength(s) | 0.9999 |
| Spacegroup name | P 64 2 2 |
| Unit cell lengths | 93.581, 93.581, 198.467 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 19.950 - 2.400 |
| R-factor | 0.25 |
| Rwork | 0.249 |
| R-free | 0.26820 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 6q9q |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.300 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | REFMAC |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 19.950 | 2.460 |
| High resolution limit [Å] | 2.400 | 2.400 |
| Rmerge | 0.062 | 0.587 |
| Rmeas | 0.064 | 0.611 |
| Rpim | 0.066 | 0.445 |
| Number of reflections | 20849 | |
| <I/σ(I)> | 27.1 | 4.8 |
| Completeness [%] | 99.6 | 98.1 |
| Redundancy | 12.7 | 12.9 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 298 | 2.25M AmSO4, 6% w/v 18-crown-ether, 0.1M HEPES |
