6GKT
X-ray structure of a non-autocrystallizing galectin-10 variant, Gal10-Tyr69Glu
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2017-12-10 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.99998 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 72.823, 93.296, 93.068 |
| Unit cell angles | 90.00, 108.94, 90.00 |
Refinement procedure
| Resolution | 42.000 - 2.100 |
| R-factor | 0.174 |
| Rwork | 0.172 |
| R-free | 0.20400 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 1lcl |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.120 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.10.2) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.230 |
| High resolution limit [Å] | 2.100 | 2.100 |
| Rmeas | 0.150 | 2.270 |
| Number of reflections | 68207 | 10924 |
| <I/σ(I)> | 9.33 | 0.7 |
| Completeness [%] | 99.0 | 98.6 |
| Redundancy | 6.9 | 6.7 |
| CC(1/2) | 0.990 | 0.360 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 298 | 0.2 M ammonium citrate pH 5.1 20% PEG 3350 |






