5X2C
Crystal structure of EGFR 696-1022 T790M/V948R in complex with SKLB(5)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | ROTATING ANODE |
Source details | BRUKER AXS MICROSTAR |
Temperature [K] | 100 |
Detector technology | IMAGE PLATE |
Collection date | 2011-08-06 |
Detector | MARRESEARCH |
Wavelength(s) | 1.5418 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 155.758, 72.451, 76.159 |
Unit cell angles | 90.00, 113.41, 90.00 |
Refinement procedure
Resolution | 37.891 - 2.050 |
R-factor | 0.1753 |
Rwork | 0.175 |
R-free | 0.20180 |
RMSD bond length | 0.017 |
RMSD bond angle | 1.594 |
Data reduction software | HKL-3000 |
Data scaling software | HKL-3000 |
Phasing software | PHASER |
Refinement software | PHENIX (1.8.4_1496) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 100.000 |
High resolution limit [Å] | 2.050 |
Number of reflections | 48272 |
<I/σ(I)> | 11.8 |
Completeness [%] | 98.7 |
Redundancy | 2.7 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | 0.1M Bis-Tris 5.0, 22.5% PEG 3350, 5mM TCEP |