5VSK
Structure of DUB complex
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-C |
Synchrotron site | APS |
Beamline | 24-ID-C |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2016-10-29 |
Detector | DECTRIS PILATUS 6M-F |
Wavelength(s) | 0.9792 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 72.390, 69.630, 77.970 |
Unit cell angles | 90.00, 99.16, 90.00 |
Refinement procedure
Resolution | 44.154 - 3.330 |
R-factor | 0.2211 |
Rwork | 0.218 |
R-free | 0.27360 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.002 |
RMSD bond angle | 0.482 |
Data reduction software | XDS |
Data scaling software | xia2 |
Phasing software | PHASER |
Refinement software | PHENIX (1.11.1_2575) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 48.650 | 48.660 | 3.390 |
High resolution limit [Å] | 3.330 | 9.020 | 3.330 |
Rmeas | 0.070 | 0.033 | 0.997 |
Rpim | 0.038 | 0.018 | 0.550 |
Total number of observations | 37783 | ||
Number of reflections | 11226 | ||
<I/σ(I)> | 13.6 | 35.3 | 1.6 |
Completeness [%] | 98.5 | 98.7 | 98 |
Redundancy | 3.4 | 3.1 | 3.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | PEG 3350, NaFormate |