5TD8

Crystal structure of an Extended Dwarf Ndc80 Complex

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	APS BEAMLINE 24-ID-C
Synchrotron site	APS
Beamline	24-ID-C
Temperature [K]	100
Detector technology	PIXEL
Collection date	2015-11-18
Detector	DECTRIS PILATUS 6M-F
Wavelength(s)	1.008
Spacegroup name	I 41 2 2
Unit cell lengths	226.825, 226.825, 237.270
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	113.413 - 7.531
R-factor	0.3132
Rwork	0.312
R-free	0.32830
Structure solution method	SIRAS
RMSD bond length	0.004
RMSD bond angle	0.754
Data scaling software	XDS
Phasing software	SOLVE
Refinement software	PHENIX ((1.10_2155: ???))

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	113.413	7.810
High resolution limit [Å]	7.530	7.530
Rmerge	0.112	2.170
Number of reflections	4140
<I/σ(I)>	14	1.5
Completeness [%]	100.0	100
Redundancy	12.4	15

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, HANGING DROP		293	16% PEG 4,000, 0.1 M CHES, pH 9.0