5SVN

Structure of IDH2 mutant R172K

Experimental procedure

実験手法	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	APS BEAMLINE 17-ID
Synchrotron site	APS
Beamline	17-ID
Temperature [K]	100
Detector technology	PIXEL
Collection date	2013-10-13
Detector	DECTRIS PILATUS3 S 6M
Wavelength(s)	1.0
Spacegroup name	P 1 21 1
格子定数 [Å]	66.691, 59.292, 105.162
格子定数 [度]	90.00, 93.27, 90.00

精密化法

分解能	41.400 - 2.100
Rwork	0.196
R-free	0.23600
Data reduction software	XDS
Data scaling software	autoPROC
Phasing software	PHENIX
Refinement software	BUSTER

Quality characteristics

	Overall
分解能 [Å] (低)	104.990
分解能 [Å] (高)	2.100
独立反射数	48015
<I/σ(I)>	19.8
完全性 [%]	99.2
冗長性	3.3

結晶化条件

結晶ID	方法	pH	温度	溶液条件
1	VAPOR DIFFUSION		298	50mM Bis-Tris pH6.5, 45% PEG400