5NEZ
crystal structure of variants
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06DA |
Synchrotron site | SLS |
Beamline | X06DA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2015-07-16 |
Detector | DECTRIS PILATUS 300K |
Wavelength(s) | 1 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 76.978, 136.409, 152.503 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 48.409 - 2.394 |
R-factor | 0.1786 |
Rwork | 0.176 |
R-free | 0.23030 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 0.973 |
Data reduction software | XDS |
Phasing software | PHASER |
Refinement software | PHENIX ((1.10pre_2119: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 48.409 | |
High resolution limit [Å] | 2.394 | |
Rmerge | 0.079 | 0.518 |
Rmeas | 0.082 | 0.539 |
Rpim | 0.022 | 0.147 |
Number of reflections | 63701 | |
<I/σ(I)> | 26.06 | |
Completeness [%] | 99.5 | |
Redundancy | 13.6 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 291 | PEG, Tris cl |