5KHW
Crystal structure of JAK1 in complex with ADP
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 17-ID |
Synchrotron site | APS |
Beamline | 17-ID |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2014-06-24 |
Detector | DECTRIS PILATUS 2M |
Wavelength(s) | 1 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 45.631, 146.620, 49.936 |
Unit cell angles | 90.00, 116.74, 90.00 |
Refinement procedure
Resolution | 73.310 - 2.470 |
R-factor | 0.1876 |
Rwork | 0.185 |
R-free | 0.23120 |
RMSD bond length | 0.010 |
RMSD bond angle | 1.140 |
Data reduction software | XDS |
Data scaling software | SCALA |
Phasing software | BUSTER |
Refinement software | BUSTER (2.11.6) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 73.310 |
High resolution limit [Å] | 2.470 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 281 | 30% PEG1500, 8% MPD, 0.1M Tris pH 9.0 |