5EC1
KcsA with V76ester mutation
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 4.2.2 |
| Synchrotron site | ALS |
| Beamline | 4.2.2 |
| Temperature [K] | 80 |
| Detector technology | CMOS |
| Collection date | 2015-06-03 |
| Detector | RDI CMOS_8M |
| Wavelength(s) | 1.0 |
| Spacegroup name | I 4 |
| Unit cell lengths | 155.600, 155.600, 75.640 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 42.776 - 2.750 |
| R-factor | 0.2463 |
| Rwork | 0.244 |
| R-free | 0.26780 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 1k4c |
| RMSD bond length | 0.002 |
| RMSD bond angle | 0.504 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.9_1690) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 55.013 | 55.013 | 2.900 |
| High resolution limit [Å] | 2.750 | 8.700 | 2.750 |
| Rmerge | 0.204 | 0.040 | 2.356 |
| Rmeas | 0.212 | ||
| Rpim | 0.055 | 0.011 | 0.653 |
| Total number of observations | 344861 | 11211 | 47949 |
| Number of reflections | 23691 | ||
| <I/σ(I)> | 13.4 | 788 | 47949 |
| Completeness [%] | 100.0 | 99.6 | 100 |
| Redundancy | 14.6 | 14.2 | 14 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 291 | PEG400 |






