5XKH
Crystal structure of T2R-TTL-CF1 complex
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL19U1 |
Synchrotron site | SSRF |
Beamline | BL19U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2015-06-05 |
Detector | PSI PILATUS 6M |
Wavelength(s) | 0.97845 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 105.515, 158.442, 180.604 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 50.000 - 2.250 |
R-factor | 0.19766 |
Rwork | 0.195 |
R-free | 0.23964 |
RMSD bond length | 0.011 |
RMSD bond angle | 1.514 |
Data reduction software | HKL-3000 |
Data scaling software | HKL-3000 |
Phasing software | PHASER |
Refinement software | REFMAC (5.8.0107) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 50.000 |
High resolution limit [Å] | 2.250 |
Number of reflections | 153248 |
<I/σ(I)> | 23.167 |
Completeness [%] | 99.7 |
Redundancy | 6.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 6.7 | 293 | 6% polyethylene glycol 4000, 8% glycerol, 0.1 M MES, 30 mM CaCl2, 30 mM MgCl2, pH 6.7 |