5SVN

Structure of IDH2 mutant R172K

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	APS BEAMLINE 17-ID
Synchrotron site	APS
Beamline	17-ID
Temperature [K]	100
Detector technology	PIXEL
Collection date	2013-10-13
Detector	DECTRIS PILATUS3 S 6M
Wavelength(s)	1.0
Spacegroup name	P 1 21 1
Unit cell lengths	66.691, 59.292, 105.162
Unit cell angles	90.00, 93.27, 90.00

Refinement procedure

Resolution	41.400 - 2.100
Rwork	0.196
R-free	0.23600
Data reduction software	XDS
Data scaling software	autoPROC
Phasing software	PHENIX
Refinement software	BUSTER

Data quality characteristics

	Overall
Low resolution limit [Å]	104.990
High resolution limit [Å]	2.100
Number of reflections	48015
<I/σ(I)>	19.8
Completeness [%]	99.2
Redundancy	3.3

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION		298	50mM Bis-Tris pH6.5, 45% PEG400