5KHW
Crystal structure of JAK1 in complex with ADP
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 17-ID |
| Synchrotron site | APS |
| Beamline | 17-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2014-06-24 |
| Detector | DECTRIS PILATUS 2M |
| Wavelength(s) | 1 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 45.631, 146.620, 49.936 |
| Unit cell angles | 90.00, 116.74, 90.00 |
Refinement procedure
| Resolution | 73.310 - 2.470 |
| R-factor | 0.1876 |
| Rwork | 0.185 |
| R-free | 0.23120 |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.140 |
| Data reduction software | XDS |
| Data scaling software | SCALA |
| Phasing software | BUSTER |
| Refinement software | BUSTER (2.11.6) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 73.310 |
| High resolution limit [Å] | 2.470 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 281 | 30% PEG1500, 8% MPD, 0.1M Tris pH 9.0 |
