5CZV
Crystal structure of Notch3 NRR in complex with 20350 Fab
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 17-ID |
| Synchrotron site | APS |
| Beamline | 17-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2012-11-28 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 1.000 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 91.917, 104.349, 92.849 |
| Unit cell angles | 90.00, 113.17, 90.00 |
Refinement procedure
| Resolution | 29.620 - 3.190 |
| R-factor | 0.2062 |
| Rwork | 0.204 |
| R-free | 0.25650 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3eto |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.230 |
| Data scaling software | SCALEPACK |
| Refinement software | BUSTER-TNT |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 30.000 | 30.000 | 3.260 |
| High resolution limit [Å] | 3.190 | 8.620 | 3.190 |
| Rmerge | 0.126 | 0.078 | 0.272 |
| Total number of observations | 29800 | ||
| Number of reflections | 11614 | ||
| <I/σ(I)> | 4.8 | ||
| Completeness [%] | 86.4 | 93.2 | 79.1 |
| Redundancy | 2.6 | 2.6 | 2.4 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 5.6 | 298 | 0.1M NaAc, pH 5.6, 17.5% (v/v) PEG3000 |
