4ZKA
High Resolution Crystal Structure of Fox1 RRM
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 293 |
| Detector technology | PIXEL |
| Collection date | 2012-09-20 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.999987 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 68.980, 77.617, 106.386 |
| Unit cell angles | 90.00, 93.99, 90.00 |
Refinement procedure
| Resolution | 45.407 - 1.800 |
| R-factor | 0.1951 |
| Rwork | 0.194 |
| R-free | 0.22650 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.008 |
| RMSD bond angle | 1.112 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | MR-Rosetta |
| Refinement software | PHENIX (1.8_1069) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 45.410 | 1.900 |
| High resolution limit [Å] | 1.800 | 1.800 |
| Rmerge | 0.072 | 0.483 |
| Number of reflections | 50898 | |
| <I/σ(I)> | 13.4 | 4.02 |
| Completeness [%] | 98.0 | 97.2 |
| Redundancy | 3.6 | |
| CC(1/2) | 0.876 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 6.5 | 293 | PEG 3350 12.5%w/v PEG 1000 12.5%w/v NPS 6.6% MPD 12.5%w/v MES 0.1M, pH 6.5 |
