4TKN
Structure of the SNX17 FERM domain bound to the second NPxF motif of KRIT1
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-E |
| Synchrotron site | APS |
| Beamline | 24-ID-E |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2013-04-13 |
| Detector | ADSC QUANTUM 315 |
| Wavelength(s) | 0.97926 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 117.924, 191.202, 46.593 |
| Unit cell angles | 90.00, 110.25, 90.00 |
Refinement procedure
| Resolution | 47.880 - 3.000 |
| R-factor | 0.223 |
| Rwork | 0.218 |
| R-free | 0.26810 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 4GXB chain A |
| RMSD bond length | 0.005 |
| RMSD bond angle | 1.245 |
| Data reduction software | DENZO |
| Data scaling software | SCALEPACK |
| Phasing software | PHASER |
| Refinement software | PHENIX ((phenix.refine: 1.9_1692)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 3.120 |
| High resolution limit [Å] | 3.000 | 3.000 |
| Rmerge | 0.241 | |
| Number of reflections | 18042 | |
| <I/σ(I)> | 10.8 | 2.3 |
| Completeness [%] | 100.0 | 100 |
| Redundancy | 15 | 14.4 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 298 | 1.9 M Ammonium Sulfate, 0.1 M HEPES pH 7.5, 5% PEG 400 |
