3QLN
Crystal structure of ATRX ADD domain in free state
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | NSLS BEAMLINE X29A |
Synchrotron site | NSLS |
Beamline | X29A |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2010-04-06 |
Detector | ADSC QUANTUM 315 |
Wavelength(s) | 1.2827 |
Spacegroup name | P 32 |
Unit cell lengths | 74.167, 74.167, 54.091 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 32.115 - 1.901 |
R-factor | 0.1298 |
Rwork | 0.127 |
R-free | 0.15830 |
Structure solution method | SAD |
RMSD bond length | 0.006 |
RMSD bond angle | 0.919 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | CNS |
Refinement software | PHENIX (1.6.2_432) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 50.000 |
High resolution limit [Å] | 1.900 |
Rmerge | 0.063 |
Number of reflections | 52327 |
<I/σ(I)> | 43.6 |
Completeness [%] | 99.9 |
Redundancy | 5.6 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 277 | 25% (v/v) PEG 4000, 100mM HEPES-NaOH, 0.2M KCL, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K |