3PPB
Crystal structure of a putative tetR family transcription regulator (Shew_3104) from SHEWANELLA SP. PV-4 at 2.10 A resolution
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRL BEAMLINE BL9-2 |
| Synchrotron site | SSRL |
| Beamline | BL9-2 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2010-07-22 |
| Detector | MARMOSAIC 325 mm CCD |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 57.762, 60.042, 107.734 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 28.919 - 2.100 |
| R-factor | 0.176 |
| Rwork | 0.174 |
| R-free | 0.20930 |
| Structure solution method | SAD |
| RMSD bond length | 0.010 |
| RMSD bond angle | 0.910 |
| Data reduction software | MOSFLM |
| Data scaling software | SCALA |
| Phasing software | SOLVE |
| Refinement software | BUSTER-TNT (BUSTER 2.8.0) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 28.919 | 28.919 | 2.150 |
| High resolution limit [Å] | 2.100 | 9.390 | 2.100 |
| Rmerge | 0.047 | 0.821 | |
| Total number of observations | 1165 | 8072 | |
| Number of reflections | 22569 | ||
| <I/σ(I)> | 8 | 21.7 | 1.9 |
| Completeness [%] | 99.9 | 95.9 | 100 |
| Redundancy | 4.8 | 4 | 4.9 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 277 | 0.2M NaCl, 30.0% PEG-400, 0.1M HEPES pH 7.5, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K |






