3O4P
DFPase at 0.85 Angstrom resolution (H atoms included)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | EMBL/DESY, HAMBURG BEAMLINE BW7B |
Synchrotron site | EMBL/DESY, HAMBURG |
Beamline | BW7B |
Detector technology | IMAGE PLATE |
Collection date | 2000-04-01 |
Detector | MAR scanner 345 mm plate |
Wavelength(s) | 0.842 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 43.114, 81.849, 86.467 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 20.800 - 0.850 |
Rwork | 0.103 |
R-free | 0.12100 |
Starting model (for MR) | DFPase model furnished by J. Koepke. |
Data reduction software | MOSFLM |
Data scaling software | SCALA |
Refinement software | MoPro |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 20.800 |
High resolution limit [Å] | 0.850 |
Number of reflections | 264548 |
Completeness [%] | 93.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | 6.5 | pH 6.5 |