3NMX
Crystal structure of APC complexed with Asef
Experimental procedure
Experimental method | SAD |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U |
Synchrotron site | SSRF |
Beamline | BL17U |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2010-04-04 |
Wavelength(s) | 0.97939 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 147.790, 92.180, 107.840 |
Unit cell angles | 90.00, 93.77, 90.00 |
Refinement procedure
Resolution | 50.000 - 2.300 |
R-factor | 0.20987 |
Rwork | 0.208 |
R-free | 0.25435 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.005 |
RMSD bond angle | 0.823 |
Data scaling software | SCALEPACK |
Phasing software | PHASER |
Refinement software | REFMAC (5.5.0102) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 50.000 | 50.000 | 2.380 |
High resolution limit [Å] | 2.300 | 4.950 | 2.300 |
Rmerge | 0.068 | 0.038 | 0.276 |
Number of reflections | 60878 | ||
<I/σ(I)> | 12.2 | ||
Completeness [%] | 95.1 | 99.5 | 72.2 |
Redundancy | 7.1 | 7.6 | 4.9 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 9 | 287 | 25% PEG 1500, 0.1M NaCl, pH 9.0, vapor diffusion, hanging drop, temperature 287K |