3K26
Complex structure of EED and trimethylated H3K4
Experimental procedure
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 5.0.1 |
| Synchrotron site | ALS |
| Beamline | 5.0.1 |
| Temperature [K] | 100 |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 57.920, 85.310, 91.390 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 19.810 - 1.580 |
| R-factor | 0.164 |
| Rwork | 0.162 |
| R-free | 0.19659 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.031 |
| RMSD bond angle | 2.409 |
| Refinement software | REFMAC (5.5.0066) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 48.940 |
| High resolution limit [Å] | 1.580 |
| Number of reflections | 58074 |
| Redundancy | 6.9 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 291 | 3.5M NaF, 10 mM TCEP, 15%Glycerol, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K |






