32TH
Crystal structure of YTHDF2 in complex with compound 20 (ZA801)
This is a non-PDB format compatible entry.
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PETRA III, EMBL c/o DESY BEAMLINE P13 (MX1) |
| Synchrotron site | PETRA III, EMBL c/o DESY |
| Beamline | P13 (MX1) |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2024-07-30 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 1 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 43.796, 46.295, 72.845 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 37.530 - 1.680 |
| R-factor | 0.1826 |
| Rwork | 0.182 |
| R-free | 0.20060 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.006 |
| RMSD bond angle | 0.813 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | PHENIX (2.1_6048) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 39.072 | 1.704 |
| High resolution limit [Å] | 1.675 | 1.675 |
| Number of reflections | 17596 | 843 |
| <I/σ(I)> | 10.2 | |
| Completeness [%] | 99.9 | |
| Redundancy | 10.5 | |
| CC(1/2) | 0.998 | 0.931 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 277.15 | Co-crystallized with ligand in 0.2 M (NH4)2SO4, 0.1 M MES pH 6.5, and 30%w/v PEG MME 5K |






