2Y35
Crystal structure of Xrn1-substrate complex
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ALS BEAMLINE 8.2.2 |
Synchrotron site | ALS |
Beamline | 8.2.2 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2010-04-18 |
Detector | ADSC CCD |
Spacegroup name | P 42 21 2 |
Unit cell lengths | 149.990, 149.990, 154.860 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 74.995 - 3.200 |
R-factor | 0.2265 |
Rwork | 0.225 |
R-free | 0.27110 |
Structure solution method | SAD |
Starting model (for MR) | NONE |
RMSD bond length | 0.011 |
RMSD bond angle | 1.017 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHENIX |
Refinement software | PHENIX |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 100.000 | 3.280 |
High resolution limit [Å] | 3.200 | 3.200 |
Rmerge | 0.100 | 0.830 |
Number of reflections | 29498 | |
<I/σ(I)> | 20 | 2.52 |
Completeness [%] | 99.1 | 95.7 |
Redundancy | 7.2 | 7 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | 6.5 | 0.1 M MES PH 6.2, 1% (V/V) PEG 300. |