2XWA
Crystal Structure of Complement Factor D Mutant R202A
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2010-05-15 |
| Detector | DECTRIS PILATUS 6M |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 44.222, 67.491, 133.588 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 40.000 - 2.800 |
| R-factor | 0.23982 |
| Rwork | 0.238 |
| R-free | 0.28297 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 1dsu |
| RMSD bond length | 0.008 |
| RMSD bond angle | 1.241 |
| Data reduction software | XDS |
| Data scaling software | SCALA |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.5.0102) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 67.490 | 2.950 |
| High resolution limit [Å] | 2.800 | 2.800 |
| Rmerge | 0.070 | 0.200 |
| Number of reflections | 10248 | |
| <I/σ(I)> | 14.5 | 4.7 |
| Completeness [%] | 98.6 | 94.5 |
| Redundancy | 3.4 | 2.8 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | 6 | pH 6.0 |
