2XKX
Single particle analysis of PSD-95 in negative stain
Refinement Statistics
Experimental method: ELECTRON MICROSCOPY (22.9 Å), SOLUTION SCATTERING
| Cell axes | 1.000 | 1.000 | 1.000 |
| Cell angles | 90.00 | 90.00 | 90.00 |
| Spacegroup | P 1 | ||
| Resolution limits | - 22.90 | ||
EM specimen
| Staining | Yes |
| Staining material | Uranyl Acetate |
EM Data Collection
| Microscope | FEI TECNAI 10 |
| Electron Gun | TUNGSTEN HAIRPIN |
| Accelerating Voltage (kV) | 100 |
| Cs (mm) | 3.6 |
| Detector | GENERIC FILM |
| Number of Images | 2 |
3D Reconstruction
| Method | SINGLE PARTICLE |
| Resolution (Å) | 22.9 |
| Software | UCSF Chimera,EMAN |
| Symmetry | C1 |
