2JIU
Crystal structure of EGFR kinase domain T790M mutation in complex with AEE788
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-C |
Synchrotron site | APS |
Beamline | 24-ID-C |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2007-03-11 |
Detector | ADSC CCD |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 48.405, 88.643, 164.867 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 24.120 - 3.050 |
R-factor | 0.214 |
Rwork | 0.211 |
R-free | 0.27700 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 2jit |
RMSD bond length | 0.014 |
RMSD bond angle | 1.367 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHASER |
Refinement software | REFMAC (5.3.0026) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 3.290 |
High resolution limit [Å] | 3.050 | 3.050 |
Rmerge | 0.100 | 0.390 |
Number of reflections | 14268 | |
<I/σ(I)> | 17.5 | 4 |
Completeness [%] | 99.8 | 99.4 |
Redundancy | 5.8 | 4.6 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | 7.5 | 0.1M HEPES 7.5, 0.3M NACL, 21% PEG6K, 5MM TCEP |