2J0S
The crystal structure of the Exon Junction Complex at 2.2 A resolution
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2006-06-17 |
Detector | MARRESEARCH |
Spacegroup name | P 64 |
Unit cell lengths | 169.440, 169.440, 71.040 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.300 |
High resolution limit [Å] | 2.200 | 2.200 |
Rmerge | 0.080 | 0.540 |
Number of reflections | 58631 | |
<I/σ(I)> | 11.1 | 2.5 |
Completeness [%] | 98.9 | 95.6 |
Redundancy | 3.6 | 2.9 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | 8% PEG 6000, 100 MM MGCL2, 100 MM MES PH 6.0 |