2Y35
Crystal structure of Xrn1-substrate complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 8.2.2 |
| Synchrotron site | ALS |
| Beamline | 8.2.2 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2010-04-18 |
| Detector | ADSC CCD |
| Spacegroup name | P 42 21 2 |
| Unit cell lengths | 149.990, 149.990, 154.860 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 74.995 - 3.200 |
| R-factor | 0.2265 |
| Rwork | 0.225 |
| R-free | 0.27110 |
| Structure solution method | SAD |
| Starting model (for MR) | NONE |
| RMSD bond length | 0.011 |
| RMSD bond angle | 1.017 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHENIX |
| Refinement software | PHENIX |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 100.000 | 3.280 |
| High resolution limit [Å] | 3.200 | 3.200 |
| Rmerge | 0.100 | 0.830 |
| Number of reflections | 29498 | |
| <I/σ(I)> | 20 | 2.52 |
| Completeness [%] | 99.1 | 95.7 |
| Redundancy | 7.2 | 7 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | 6.5 | 0.1 M MES PH 6.2, 1% (V/V) PEG 300. |
