2O26
Structure of a class III RTK signaling assembly
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 5ID-B |
Synchrotron site | APS |
Beamline | 5ID-B |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2005-04-12 |
Detector | MAR CCD 165 mm |
Wavelength(s) | 1.0 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 76.849, 200.154, 82.023 |
Unit cell angles | 90.00, 91.42, 90.00 |
Refinement procedure
Resolution | 19.930 - 2.500 |
R-factor | 0.237 |
Rwork | 0.237 |
R-free | 0.27000 |
Structure solution method | SIRAS |
RMSD bond length | 0.007 |
RMSD bond angle | 1.400 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | SOLVE |
Refinement software | CNS (1.1) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 20.000 | 2.600 |
High resolution limit [Å] | 2.500 | 2.500 |
Rmerge | 0.040 | 0.389 |
Number of reflections | 82592 | |
<I/σ(I)> | 17.1 | 2.6 |
Completeness [%] | 96.8 | 93.3 |
Redundancy | 2.9 | 2.9 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 6 | 293 | PEG, MES, pH 6.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K |