2H9E
Crystal Structure of FXa/selectide/NAPC2 ternary complex
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 14-BM-C |
Synchrotron site | APS |
Beamline | 14-BM-C |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2001-07-09 |
Detector | MAR CCD 165 mm |
Wavelength(s) | 1.01 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 48.945, 86.410, 145.892 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 74.330 - 2.200 |
R-factor | 0.22209 |
Rwork | 0.220 |
R-free | 0.26832 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.024 |
RMSD bond angle | 2.142 |
Phasing software | AMoRE |
Refinement software | REFMAC (5.2.0005) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 37.170 | 2.260 |
High resolution limit [Å] | 2.200 | 2.200 |
Number of reflections | 32172 | |
Completeness [%] | 99.6 | 99.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 5.6 | 293 | peg 8000, potassium dihydrogen phosphate, acetate ion, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K |