2H9E
Crystal Structure of FXa/selectide/NAPC2 ternary complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 14-BM-C |
| Synchrotron site | APS |
| Beamline | 14-BM-C |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2001-07-09 |
| Detector | MAR CCD 165 mm |
| Wavelength(s) | 1.01 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 48.945, 86.410, 145.892 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 74.330 - 2.200 |
| R-factor | 0.22209 |
| Rwork | 0.220 |
| R-free | 0.26832 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.024 |
| RMSD bond angle | 2.142 |
| Phasing software | AMoRE |
| Refinement software | REFMAC (5.2.0005) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 37.170 | 2.260 |
| High resolution limit [Å] | 2.200 | 2.200 |
| Number of reflections | 32172 | |
| Completeness [%] | 99.6 | 99.5 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 5.6 | 293 | peg 8000, potassium dihydrogen phosphate, acetate ion, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K |






