1RFX
Crystal Structure of resisitin
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | NSLS BEAMLINE X4A |
Synchrotron site | NSLS |
Beamline | X4A |
Temperature [K] | 110 |
Detector technology | CCD |
Collection date | 2002-06-14 |
Detector | ADSC QUANTUM 4 |
Wavelength(s) | 1.54975 |
Spacegroup name | C 2 2 21 |
Unit cell lengths | 44.298, 174.670, 90.163 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 14.860 - 2.002 |
R-factor | 0.17915 |
Rwork | 0.177 |
R-free | 0.21597 |
Structure solution method | SAD |
RMSD bond length | 0.009 |
RMSD bond angle | 1.230 |
Data reduction software | DENZO |
Data scaling software | SCALEPACK |
Phasing software | SHARP |
Refinement software | REFMAC (5.1) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 30.000 | 2.070 |
High resolution limit [Å] | 2.000 | 2.000 |
Rmerge | 0.071 | 0.213 |
Number of reflections | 24119 | |
<I/σ(I)> | 25 | 9.6 |
Completeness [%] | 97.4 | 95.2 |
Redundancy | 25.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 2 | 277 | 0.1M Sodium acetate, 8% PEG 4000, 0.1M Potassium Chloride, pH 2., VAPOR DIFFUSION, HANGING DROP, temperature 277K |