ソフトウェア 名称 バージョン 分類 REFMAC5.8.0258精密化 HKL-2000データ削減 HKL-2000データスケーリング MOLREP位相決定
精密化 構造決定の手法 : 分子置換開始モデル : 1F8Q解像度 : 1.519→15.734 Å / Cor.coef. Fo :Fc : 0.908 / Cor.coef. Fo :Fc free : 0.87 / WRfactor Rfree : 0.347 / WRfactor Rwork : 0.283 / SU B : 4.672 / SU ML : 0.085 / Average fsc free : 0.8432 / Average fsc work : 0.8636 / 交差検証法 : FREE R-VALUE / ESU R : 0.136 / ESU R Free : 0.137 / 詳細 : Hydrogens have been added in their riding positionsRfactor 反射数 %反射 Rfree 0.299 1547 5.169 % Rwork 0.2461 28384 - all 0.249 - - obs - 29931 80.812 %
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK BULK SOLVENT原子変位パラメータ Biso mean : 21.449 Å2 Baniso -1 Baniso -2 Baniso -3 1- -1.149 Å2 -0.575 Å2 0 Å2 2- - -1.149 Å2 0 Å2 3- - - 3.729 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.519→15.734 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 1924 0 37 202 2163
拘束条件 大きな表を表示 (5 x 29) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.009 0.013 2008 X-RAY DIFFRACTION r_bond_other_d0.001 0.017 1887 X-RAY DIFFRACTION r_angle_refined_deg1.663 1.672 2734 X-RAY DIFFRACTION r_angle_other_deg1.438 1.584 4363 X-RAY DIFFRACTION r_dihedral_angle_1_deg6.415 5 246 X-RAY DIFFRACTION r_dihedral_angle_2_deg35.041 21.442 104 X-RAY DIFFRACTION r_dihedral_angle_3_deg14.023 15 334 X-RAY DIFFRACTION r_dihedral_angle_4_deg26.008 15 16 X-RAY DIFFRACTION r_chiral_restr0.08 0.2 275 X-RAY DIFFRACTION r_gen_planes_refined0.009 0.02 2229 X-RAY DIFFRACTION r_gen_planes_other0.002 0.02 427 X-RAY DIFFRACTION r_nbd_refined0.229 0.2 431 X-RAY DIFFRACTION r_symmetry_nbd_other0.19 0.2 1874 X-RAY DIFFRACTION r_nbtor_refined0.17 0.2 996 X-RAY DIFFRACTION r_symmetry_nbtor_other0.081 0.2 923 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.168 0.2 114 X-RAY DIFFRACTION r_symmetry_nbd_refined0.307 0.2 30 X-RAY DIFFRACTION r_nbd_other0.316 0.2 49 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_refined0.194 0.2 17 X-RAY DIFFRACTION r_mcbond_it1.084 1.891 984 X-RAY DIFFRACTION r_mcbond_other1.081 1.889 983 X-RAY DIFFRACTION r_mcangle_it1.632 2.835 1230 X-RAY DIFFRACTION r_mcangle_other1.632 2.837 1231 X-RAY DIFFRACTION r_scbond_it1.747 2.15 1024 X-RAY DIFFRACTION r_scbond_other1.746 2.151 1025 X-RAY DIFFRACTION r_scangle_it2.691 3.144 1504 X-RAY DIFFRACTION r_scangle_other2.69 3.146 1505 X-RAY DIFFRACTION r_lrange_it4.217 23.45 2307 X-RAY DIFFRACTION r_lrange_other4.125 23.087 2278
LS精密化 シェル 大きな表を表示 (7 x 20) 大きな表を隠す 解像度 (Å)Rfactor Rfree Num. reflection Rfree Rfactor Rwork Num. reflection Rwork Refine-ID % reflection obs (%)1.519-1.558 0.322 123 0.26 2268 X-RAY DIFFRACTION 87.1673 1.558-1.601 0.292 105 0.25 2530 X-RAY DIFFRACTION 98.3209 1.601-1.647 0.277 131 0.243 2383 X-RAY DIFFRACTION 97.669 1.647-1.698 0.28 172 0.235 2320 X-RAY DIFFRACTION 97.3438 1.698-1.753 0.263 122 0.226 2220 X-RAY DIFFRACTION 97.0576 1.753-1.815 0.285 104 0.228 2133 X-RAY DIFFRACTION 94.5877 1.815-1.883 0.232 109 0.217 2038 X-RAY DIFFRACTION 94.4151 1.883-1.96 0.337 91 0.22 1955 X-RAY DIFFRACTION 92.6211 1.96-2.047 0.266 78 0.216 1753 X-RAY DIFFRACTION 87.149 2.047-2.147 0.255 92 0.216 1564 X-RAY DIFFRACTION 82.9659 2.147-2.263 0.272 91 0.214 1447 X-RAY DIFFRACTION 79.6891 2.263-2.4 0.274 86 0.241 1303 X-RAY DIFFRACTION 76.1096 2.4-2.566 0.311 68 0.244 1157 X-RAY DIFFRACTION 72.9601 2.566-2.771 0.315 59 0.253 989 X-RAY DIFFRACTION 66.7516 2.771-3.035 0.301 47 0.273 850 X-RAY DIFFRACTION 60.8548 3.035-3.392 0.349 33 0.296 596 X-RAY DIFFRACTION 47.6154 3.392-3.915 0.363 15 0.284 382 X-RAY DIFFRACTION 34.612 3.915-4.791 0.526 12 0.304 208 X-RAY DIFFRACTION 22.2898 4.791-6.758 0.495 7 0.359 223 X-RAY DIFFRACTION 30.3831 6.758-10 0.244 2 65 X-RAY DIFFRACTION
精密化 TLS 手法 : refined / Origin x : 21.2002 Å / Origin y : 11.4001 Å / Origin z : 0.0029 Å11 12 13 21 22 23 31 32 33 T 0.0264 Å2 -0.0044 Å2 0.0043 Å2 - 0.0312 Å2 -0.0052 Å2 - - 0.002 Å2 L 0.1307 °2 0.0803 °2 -0.0422 °2 - 0.2662 °2 -0.0998 °2 - - 0.0444 °2 S 0.007 Å ° -0.0078 Å ° -0.0043 Å ° -0.0059 Å ° -0.0105 Å ° -0.0059 Å ° 0.0036 Å ° 0.0084 Å ° 0.0036 Å °
精密化 TLSグループ Selection : ALL