ソフトウェア 名称 バージョン 分類 REFMAC5.8.0258精密化 HKL-2000V718データ削減 HKL-2000V718データスケーリング MOLREPV11.7位相決定
精密化 構造決定の手法 : 分子置換開始モデル : 1F8Q解像度 : 1.331→24.604 Å / Cor.coef. Fo :Fc : 0.95 / Cor.coef. Fo :Fc free : 0.857 / WRfactor Rfree : 0.279 / WRfactor Rwork : 0.236 / SU B : 2.801 / SU ML : 0.053 / Average fsc free : 0.8302 / Average fsc work : 0.8321 / 交差検証法 : FREE R-VALUE / ESU R : 0.066 / ESU R Free : 0.071 / 詳細 : Hydrogens have been added in their riding positionsRfactor 反射数 %反射 Rfree 0.2572 2788 5.037 % Rwork 0.2157 52564 - all 0.218 - - obs - 55352 95.879 %
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK BULK SOLVENT原子変位パラメータ Biso mean : 25.452 Å2 Baniso -1 Baniso -2 Baniso -3 1- -0.802 Å2 -0.401 Å2 0 Å2 2- - -0.802 Å2 0 Å2 3- - - 2.602 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.331→24.604 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 1932 0 22 196 2150
拘束条件 大きな表を表示 (5 x 29) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.009 0.013 1993 X-RAY DIFFRACTION r_bond_other_d0.001 0.017 1875 X-RAY DIFFRACTION r_angle_refined_deg1.511 1.664 2713 X-RAY DIFFRACTION r_angle_other_deg1.425 1.575 4333 X-RAY DIFFRACTION r_dihedral_angle_1_deg5.838 5 245 X-RAY DIFFRACTION r_dihedral_angle_2_deg31.863 21.442 104 X-RAY DIFFRACTION r_dihedral_angle_3_deg12.973 15 334 X-RAY DIFFRACTION r_dihedral_angle_4_deg23.999 15 16 X-RAY DIFFRACTION r_chiral_restr0.072 0.2 272 X-RAY DIFFRACTION r_gen_planes_refined0.007 0.02 2210 X-RAY DIFFRACTION r_gen_planes_other0.001 0.02 423 X-RAY DIFFRACTION r_nbd_refined0.21 0.2 379 X-RAY DIFFRACTION r_symmetry_nbd_other0.174 0.2 1788 X-RAY DIFFRACTION r_nbtor_refined0.17 0.2 997 X-RAY DIFFRACTION r_symmetry_nbtor_other0.082 0.2 855 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.109 0.2 129 X-RAY DIFFRACTION r_symmetry_nbd_refined0.06 0.2 3 X-RAY DIFFRACTION r_nbd_other0.167 0.2 30 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_refined0.126 0.2 6 X-RAY DIFFRACTION r_mcbond_it1.101 2.081 983 X-RAY DIFFRACTION r_mcbond_other1.1 2.079 982 X-RAY DIFFRACTION r_mcangle_it1.641 3.12 1227 X-RAY DIFFRACTION r_mcangle_other1.641 3.122 1228 X-RAY DIFFRACTION r_scbond_it1.722 2.418 1010 X-RAY DIFFRACTION r_scbond_other1.722 2.418 1010 X-RAY DIFFRACTION r_scangle_it2.668 3.551 1486 X-RAY DIFFRACTION r_scangle_other2.667 3.556 1487 X-RAY DIFFRACTION r_lrange_it4.49 26.169 2268 X-RAY DIFFRACTION r_lrange_other4.489 26.175 2269
LS精密化 シェル 大きな表を表示 (7 x 20) 大きな表を隠す 解像度 (Å)Rfactor Rfree Num. reflection Rfree Rfactor Rwork Num. reflection Rwork Refine-ID % reflection obs (%)1.331-1.366 0.375 187 0.353 3975 X-RAY DIFFRACTION 97.3795 1.366-1.403 0.333 186 0.323 3970 X-RAY DIFFRACTION 100 1.403-1.444 0.311 197 0.29 3835 X-RAY DIFFRACTION 100 1.444-1.488 0.262 232 0.256 3702 X-RAY DIFFRACTION 100 1.488-1.537 0.251 173 0.222 3660 X-RAY DIFFRACTION 100 1.537-1.591 0.231 199 0.201 3515 X-RAY DIFFRACTION 100 1.591-1.651 0.237 186 0.2 3344 X-RAY DIFFRACTION 100 1.651-1.718 0.223 184 0.193 3217 X-RAY DIFFRACTION 100 1.718-1.794 0.23 179 0.193 3096 X-RAY DIFFRACTION 100 1.794-1.882 0.219 147 0.197 3005 X-RAY DIFFRACTION 99.9683 1.882-1.984 0.19 125 2806 X-RAY DIFFRACTION 98.6869 1.984-2.104 0.218 135 0.197 2693 X-RAY DIFFRACTION 99.894 2.104-2.249 0.222 148 0.194 2451 X-RAY DIFFRACTION 98.1866 2.249-2.429 0.232 117 0.192 2240 X-RAY DIFFRACTION 95.6575 2.429-2.66 0.265 129 0.199 2111 X-RAY DIFFRACTION 98.0736 2.66-2.974 0.236 111 0.203 1818 X-RAY DIFFRACTION 94.0517 2.974-3.433 0.262 63 0.225 1463 X-RAY DIFFRACTION 84.7778 3.433-4.201 0.306 44 0.233 776 X-RAY DIFFRACTION 53.1432 4.201-5.929 0.265 31 617 X-RAY DIFFRACTION 54.9153 5.929-10 0.775 15 0.346 270 X-RAY DIFFRACTION 43.7788
精密化 TLS 手法 : refined / Origin x : -20.4672 Å / Origin y : -12.6721 Å / Origin z : 0.0318 Å11 12 13 21 22 23 31 32 33 T 0.0246 Å2 -0.0159 Å2 -0.0057 Å2 - 0.0259 Å2 0.0119 Å2 - - 0.0245 Å2 L 0.9848 °2 -0.178 °2 -0.3474 °2 - 0.5506 °2 -0.0482 °2 - - 0.1529 °2 S 0.0436 Å ° 0.0518 Å ° -0.0459 Å ° 0.0708 Å ° -0.0437 Å ° 0.0183 Å ° -0.0316 Å ° -0.018 Å ° 0 Å °
精密化 TLSグループ Selection : ALL