ソフトウェア 名称 バージョン 分類 REFMAC5.8.0258精密化 HKL-2000データ削減 HKL-2000データスケーリング MOLREP位相決定
精密化 構造決定の手法 : 分子置換開始モデル : 1F8Q解像度 : 1.35→14.951 Å / Cor.coef. Fo :Fc : 0.872 / Cor.coef. Fo :Fc free : 0.835 / SU B : 4.734 / SU ML : 0.092 / 交差検証法 : FREE R-VALUE / ESU R : 0.1 / ESU R Free : 0.104 / 詳細 : Hydrogens have been added in their riding positionsRfactor 反射数 %反射 Rfree 0.3495 2505 4.958 % Rwork 0.3 - - all 0.306 - - obs - 50526 92.175 %
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å原子変位パラメータ Biso mean : 27.081 Å2 Baniso -1 Baniso -2 Baniso -3 1- -0.629 Å2 -0.315 Å2 -0 Å2 2- - -0.629 Å2 0 Å2 3- - - 2.041 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.35→14.951 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 1932 0 22 179 2133
拘束条件 大きな表を表示 (5 x 29) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.012 0.013 2009 X-RAY DIFFRACTION r_bond_other_d0.001 0.017 1893 X-RAY DIFFRACTION r_angle_refined_deg1.941 1.662 2735 X-RAY DIFFRACTION r_angle_other_deg1.449 1.577 4378 X-RAY DIFFRACTION r_dihedral_angle_1_deg6.616 5 249 X-RAY DIFFRACTION r_dihedral_angle_2_deg36.959 21.442 104 X-RAY DIFFRACTION r_dihedral_angle_3_deg15.604 15 339 X-RAY DIFFRACTION r_dihedral_angle_4_deg26.957 15 16 X-RAY DIFFRACTION r_chiral_restr0.091 0.2 272 X-RAY DIFFRACTION r_gen_planes_refined0.011 0.02 2238 X-RAY DIFFRACTION r_gen_planes_other0.002 0.02 427 X-RAY DIFFRACTION r_nbd_refined0.208 0.2 450 X-RAY DIFFRACTION r_symmetry_nbd_other0.193 0.2 1918 X-RAY DIFFRACTION r_nbtor_refined0.174 0.2 977 X-RAY DIFFRACTION r_symmetry_nbtor_other0.086 0.2 937 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.151 0.2 114 X-RAY DIFFRACTION r_symmetry_nbd_refined0.424 0.2 9 X-RAY DIFFRACTION r_nbd_other0.326 0.2 40 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_refined0.231 0.2 6 X-RAY DIFFRACTION r_mcbond_it1.343 2.039 993 X-RAY DIFFRACTION r_mcbond_other1.342 2.038 992 X-RAY DIFFRACTION r_mcangle_it1.862 3.058 1243 X-RAY DIFFRACTION r_mcangle_other1.862 3.06 1244 X-RAY DIFFRACTION r_scbond_it1.794 2.272 1016 X-RAY DIFFRACTION r_scbond_other1.778 2.266 1013 X-RAY DIFFRACTION r_scangle_it2.588 3.341 1492 X-RAY DIFFRACTION r_scangle_other2.588 3.343 1493 X-RAY DIFFRACTION r_lrange_it4.814 25.474 2303 X-RAY DIFFRACTION r_lrange_other4.814 25.471 2304
LS精密化 シェル 大きな表を表示 (7 x 20) 大きな表を隠す 解像度 (Å)Rfactor Rfree Num. reflection Rfree Rfactor Rwork Num. reflection Rwork Refine-ID % reflection obs (%)1.35-1.385 0.352 191 3661 X-RAY DIFFRACTION 96.0599 1.385-1.423 0.331 216 3750 X-RAY DIFFRACTION 99.6983 1.423-1.465 0.321 179 0.3 3672 X-RAY DIFFRACTION 99.6378 1.465-1.51 0.294 185 0.277 3522 X-RAY DIFFRACTION 99.1442 1.51-1.559 0.291 166 0.27 3381 X-RAY DIFFRACTION 98.6923 1.559-1.614 0.302 162 0.265 3262 X-RAY DIFFRACTION 98.3625 1.614-1.675 0.327 172 0.261 3162 X-RAY DIFFRACTION 98.3481 1.675-1.743 0.347 171 0.258 3031 X-RAY DIFFRACTION 98.0404 1.743-1.82 0.286 168 0.251 2858 X-RAY DIFFRACTION 97.6444 1.82-1.909 0.316 138 0.258 2761 X-RAY DIFFRACTION 96.5368 1.909-2.012 0.334 124 0.274 2558 X-RAY DIFFRACTION 95.7857 2.012-2.134 0.311 121 0.261 2453 X-RAY DIFFRACTION 95.6166 2.134-2.282 0.294 121 0.273 2267 X-RAY DIFFRACTION 94.5743 2.282-2.464 0.348 110 0.296 2080 X-RAY DIFFRACTION 93.43 2.464-2.699 0.361 85 0.291 1910 X-RAY DIFFRACTION 92.9204 2.699-3.017 0.347 81 0.304 1565 X-RAY DIFFRACTION 84.6273 3.017-3.482 0.402 66 0.337 1104 X-RAY DIFFRACTION 67.9443 3.482-4.262 0.506 22 0.419 558 X-RAY DIFFRACTION 39.6717 4.262-6.015 0.511 21 329 X-RAY DIFFRACTION 31.3901 6.015-10 0.447 6 137 X-RAY DIFFRACTION 22.807
精密化 TLS 手法 : refined / Origin x : -20.5121 Å / Origin y : -12.6522 Å / Origin z : -0.0213 Å11 12 13 21 22 23 31 32 33 T 0.0321 Å2 -0.0073 Å2 -0.0117 Å2 - 0.0192 Å2 0.023 Å2 - - 0.0528 Å2 L 1.8122 °2 -0.245 °2 -0.5867 °2 - 0.9752 °2 -0.0339 °2 - - 0.2052 °2 S 0.0905 Å ° 0.102 Å ° -0.0171 Å ° 0.1427 Å ° -0.0819 Å ° -0.022 Å ° -0.0495 Å ° -0.0297 Å ° -0.0087 Å °
精密化 TLSグループ Selection : ALL