ソフトウェア | 名称 | バージョン | 分類 | NB |
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XSCALE | | データスケーリング | | PHASER | 2.1.4位相決定 | | REFMAC | | 精密化 | | PDB_EXTRACT | 3.11 | データ抽出 | | XDS | | データスケーリング | | |
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精密化 | 構造決定の手法: 分子置換 開始モデル: PDB ENTRY 4LOE 解像度: 1.9→48.34 Å / Cor.coef. Fo:Fc: 0.951 / Cor.coef. Fo:Fc free: 0.928 / WRfactor Rfree: 0.2101 / WRfactor Rwork: 0.1708 / Occupancy max: 1 / Occupancy min: 0.3 / FOM work R set: 0.8371 / SU B: 7.561 / SU ML: 0.107 / SU R Cruickshank DPI: 0.1634 / SU Rfree: 0.1466 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.163 / ESU R Free: 0.147 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : WITH TLS ADDED
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.221 | 1784 | 5 % | RANDOM |
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Rwork | 0.1793 | - | - | - |
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all | 0.1814 | 35636 | - | - |
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obs | 0.1814 | 33891 | 100 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK |
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原子変位パラメータ | Biso max: 130.32 Å2 / Biso mean: 24.0539 Å2 / Biso min: 7.25 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0.53 Å2 | 0 Å2 | -0.16 Å2 |
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2- | - | -1.03 Å2 | 0 Å2 |
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3- | - | - | 0.41 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 1.9→48.34 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 3403 | 0 | 109 | 418 | 3930 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.011 | 0.022 | 3645 | X-RAY DIFFRACTION | r_angle_refined_deg1.258 | 2.003 | 4957 | X-RAY DIFFRACTION | r_dihedral_angle_1_deg5.274 | 5 | 454 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg31.657 | 23.614 | 166 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg12.713 | 15 | 579 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg14.786 | 15 | 30 | X-RAY DIFFRACTION | r_chiral_restr0.084 | 0.2 | 552 | X-RAY DIFFRACTION | r_gen_planes_refined0.006 | 0.021 | 2769 | X-RAY DIFFRACTION | r_mcbond_it0.501 | 1.5 | 2208 | X-RAY DIFFRACTION | r_mcangle_it0.909 | 2 | 3575 | X-RAY DIFFRACTION | r_scbond_it1.747 | 3 | 1437 | X-RAY DIFFRACTION | r_scangle_it2.76 | 4.5 | 1372 | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.9→1.949 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.326 | 121 | - |
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Rwork | 0.319 | 2294 | - |
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all | - | 2415 | - |
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obs | - | - | 100 % |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 1.7011 | -0.0667 | -0.007 | 3.6354 | -0.0235 | 2.4432 | 0.0352 | -0.2378 | -0.1298 | 0.492 | -0.0278 | -0.2211 | 0.1382 | 0.1623 | -0.0075 | 0.1156 | -0.038 | -0.0364 | 0.0903 | -0.0048 | 0.0616 | 17.7597 | -14.5297 | 25.817 | 2 | 0.3901 | 0.3297 | -0.041 | 2.5914 | -0.083 | 0.702 | -0.0054 | 0.1253 | -0.0765 | -0.2115 | -0.0151 | -0.0995 | 0.0443 | 0.0149 | 0.0205 | 0.0643 | 0.0001 | 0.0325 | 0.0971 | -0.0069 | 0.0792 | 12.8334 | -19.1187 | 0.2558 | 3 | 39.8403 | 14.5462 | 29.7031 | 5.209 | 11.3866 | 24.7402 | 2.0242 | -1.9174 | -2.9406 | 0.841 | -0.7926 | -1.0427 | 1.5996 | -0.9025 | -1.2317 | 0.2668 | -0.0736 | -0.1873 | 0.4102 | 0.6336 | 1.234 | 28.0044 | -23.045 | -2.2542 | 4 | 19.1309 | 1.2508 | 13.2935 | 1.8115 | 0.9335 | 11.4472 | 0.261 | 0.0216 | -1.0459 | -0.4566 | 0.055 | -0.4663 | -0.0493 | -0.0593 | -0.316 | 0.1709 | 0.0485 | 0.0942 | 0.0926 | 0.0342 | 0.2667 | 23.2048 | -14.7781 | -11.1772 | 5 | 0.7034 | 0.2071 | -0.009 | 1.6662 | -0.1192 | 0.5871 | 0.0532 | -0.0075 | -0.0319 | 0.1268 | -0.0798 | -0.0574 | -0.0065 | -0.0118 | 0.0266 | 0.0231 | 0.0005 | -0.0031 | 0.0386 | -0.0115 | 0.0428 | 10.3179 | -21.6234 | 11.0805 | 6 | 8.1061 | -8.4766 | 7.7557 | 120.5231 | 15.3127 | 4.718 | 0.447 | -1.025 | -0.0199 | 0.4703 | -0.9769 | 1.5395 | 0.2538 | -0.9657 | 0.5299 | 0.2785 | -0.0835 | 0.0221 | 0.5048 | -0.2566 | 0.4564 | 2.6099 | -46.3895 | -7.116 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Auth seq-ID |
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1 | X-RAY DIFFRACTION | 1 | A-14 - 70 | 2 | X-RAY DIFFRACTION | 2 | A71 - 166 | 3 | X-RAY DIFFRACTION | 3 | A167 - 187 | 4 | X-RAY DIFFRACTION | 4 | A188 - 216 | 5 | X-RAY DIFFRACTION | 5 | A217 - 416 | 6 | X-RAY DIFFRACTION | 6 | A417 - 423 | | | | | | |
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