解像度: 0.97→27.2 Å / Cor.coef. Fo:Fc: 0.978 / Cor.coef. Fo:Fc free: 0.973 / SU B: 0.485 / SU ML: 0.012 / Isotropic thermal model: Isotropic with TLS / 交差検証法: THROUGHOUT / ESU R Free: 0.019 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.14501
13672
5 %
RANDOM
Rwork
0.12687
-
-
-
obs
0.12779
270983
98.67 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 12.664 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.59 Å2
0 Å2
-0.43 Å2
2-
-
-0.2 Å2
0 Å2
3-
-
-
0.71 Å2
精密化ステップ
サイクル: LAST / 解像度: 0.97→27.2 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3811
0
21
724
4556
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.007
0.022
4009
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.406
1.94
5469
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.99
5
491
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.862
24.225
213
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
10.797
15
628
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
13.984
15
23
X-RAY DIFFRACTION
r_chiral_restr
0.096
0.2
564
X-RAY DIFFRACTION
r_gen_planes_refined
0.01
0.021
3177
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.273
1.5
2374
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.853
2
3832
X-RAY DIFFRACTION
r_scbond_it
2.6
3
1635
X-RAY DIFFRACTION
r_scangle_it
3.726
4.5
1627
X-RAY DIFFRACTION
r_rigid_bond_restr
1.197
3
4009
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 0.97→1.023 Å / Total num. of bins used: 10
Rfactor
反射数
%反射
Rfree
0.225
1975
-
Rwork
0.217
37629
-
obs
-
39604
99.06 %
精密化 TLS
手法: refined / Origin x: -29.1075 Å / Origin y: 87.7197 Å / Origin z: 15.5499 Å