解像度: 1.28→22.9 Å / Cor.coef. Fo:Fc: 0.979 / Cor.coef. Fo:Fc free: 0.973 / SU B: 0.947 / SU ML: 0.019 / Isotropic thermal model: Isotropic with TLS / 交差検証法: THROUGHOUT / ESU R Free: 0.038 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.14383
6025
5 %
RANDOM
Rwork
0.12045
-
-
-
obs
0.12162
119863
99.47 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 13.15 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.78 Å2
0 Å2
-0.44 Å2
2-
-
-0.03 Å2
0 Å2
3-
-
-
0.72 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.28→22.9 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3810
0
62
640
4512
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.007
0.022
4092
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.399
1.953
5597
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.852
5
505
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.095
24.279
215
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
10.695
15
637
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.05
15
23
X-RAY DIFFRACTION
r_chiral_restr
0.096
0.2
580
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.021
3253
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.246
1.5
2395
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.88
2
3876
X-RAY DIFFRACTION
r_scbond_it
2.74
3
1697
X-RAY DIFFRACTION
r_scangle_it
3.994
4.5
1704
X-RAY DIFFRACTION
r_rigid_bond_restr
1.24
3
4092
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.279→1.348 Å / Total num. of bins used: 10
Rfactor
反射数
%反射
Rfree
0.174
858
-
Rwork
0.136
16313
-
obs
-
17171
98.44 %
精密化 TLS
手法: refined / Origin x: -29.1475 Å / Origin y: 87.8346 Å / Origin z: 15.5466 Å