解像度: 1.11→27.43 Å / Cor.coef. Fo:Fc: 0.981 / Cor.coef. Fo:Fc free: 0.978 / SU B: 1.332 / SU ML: 0.028 / 交差検証法: THROUGHOUT / ESU R: 0.035 / ESU R Free: 0.033 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.16663
1217
5 %
RANDOM
Rwork
0.15071
-
-
-
obs
0.15151
23056
92.79 %
-
all
-
26161
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 15.91 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.75 Å2
-0 Å2
-0.17 Å2
2-
-
-0.91 Å2
-0 Å2
3-
-
-
-0.85 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.11→27.43 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
562
0
4
86
652
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.025
0.022
622
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
454
X-RAY DIFFRACTION
r_angle_refined_deg
2.271
2.015
852
X-RAY DIFFRACTION
r_angle_other_deg
1.586
3
1130
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.383
5
79
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
40.621
25.862
29
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.379
15
122
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.098
15
4
X-RAY DIFFRACTION
r_chiral_restr
0.136
0.2
93
X-RAY DIFFRACTION
r_gen_planes_refined
0.011
0.021
677
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
108
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
2.519
1.5
369
X-RAY DIFFRACTION
r_mcbond_other
0.794
1.5
140
X-RAY DIFFRACTION
r_mcangle_it
3.85
2
612
X-RAY DIFFRACTION
r_scbond_it
5.223
3
253
X-RAY DIFFRACTION
r_scangle_it
8.198
4.5
233
X-RAY DIFFRACTION
r_rigid_bond_restr
2.112
3
1076
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.11→1.139 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.291
57
-
Rwork
0.337
1075
-
obs
-
-
59.36 %
精密化 TLS
手法: refined / Origin x: 6.401 Å / Origin y: 5.769 Å / Origin z: 2.544 Å