ソフトウェア | 名称 | バージョン | 分類 | NB |
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MOSFLM | | データ削減 | | SCALA | 3.2.25データスケーリング | | PHASER | | 位相決定 | | REFMAC | | 精密化 | | PDB_EXTRACT | 3.006 | データ抽出 | | |
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精密化 | 構造決定の手法: 分子置換 開始モデル: PDB ENTRY 2A8D 解像度: 2.8→28.84 Å / Cor.coef. Fo:Fc: 0.93 / Cor.coef. Fo:Fc free: 0.899 / WRfactor Rfree: 0.204 / WRfactor Rwork: 0.173 / Occupancy max: 1 / Occupancy min: 1 / FOM work R set: 0.866 / SU B: 22.129 / SU ML: 0.209 / SU R Cruickshank DPI: 0.505 / SU Rfree: 0.293 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.502 / ESU R Free: 0.292 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.233 | 812 | 5.1 % | RANDOM |
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Rwork | 0.194 | - | - | - |
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obs | 0.196 | 16044 | 98.13 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK |
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原子変位パラメータ | Biso max: 71.51 Å2 / Biso mean: 39.558 Å2 / Biso min: 7.86 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0.19 Å2 | 0 Å2 | 0 Å2 |
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2- | - | 0.19 Å2 | 0 Å2 |
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3- | - | - | -0.38 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 2.8→28.84 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2890 | 0 | 2 | 21 | 2913 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.012 | 0.021 | 2960 | X-RAY DIFFRACTION | r_bond_other_d0.001 | 0.02 | 1954 | X-RAY DIFFRACTION | r_angle_refined_deg1.349 | 1.93 | 4014 | X-RAY DIFFRACTION | r_angle_other_deg0.875 | 3.002 | 4758 | X-RAY DIFFRACTION | r_dihedral_angle_1_deg7.186 | 5 | 362 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg40.516 | 23.824 | 136 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg19.228 | 15 | 508 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg21.982 | 15 | 18 | X-RAY DIFFRACTION | r_chiral_restr0.067 | 0.2 | 456 | X-RAY DIFFRACTION | r_gen_planes_refined0.004 | 0.02 | 3268 | X-RAY DIFFRACTION | r_gen_planes_other0.001 | 0.02 | 598 | X-RAY DIFFRACTION | r_nbd_refined0.232 | 0.2 | 775 | X-RAY DIFFRACTION | r_nbd_other0.204 | 0.2 | 2115 | X-RAY DIFFRACTION | r_nbtor_refined0.186 | 0.2 | 1436 | X-RAY DIFFRACTION | r_nbtor_other0.091 | 0.2 | 1583 | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.183 | 0.2 | 79 | X-RAY DIFFRACTION | r_xyhbond_nbd_other0.076 | 0.2 | 3 | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.179 | 0.2 | 24 | X-RAY DIFFRACTION | r_symmetry_vdw_other0.328 | 0.2 | 36 | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.279 | 0.2 | 4 | X-RAY DIFFRACTION | r_mcbond_it0.714 | 1.5 | 2326 | X-RAY DIFFRACTION | r_mcbond_other0.082 | 1.5 | 744 | X-RAY DIFFRACTION | r_mcangle_it0.843 | 2 | 2904 | X-RAY DIFFRACTION | r_scbond_it1.062 | 3 | 1340 | X-RAY DIFFRACTION | r_scangle_it1.677 | 4.5 | 1110 | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.8→2.871 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.257 | 70 | - |
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Rwork | 0.244 | 1043 | - |
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all | - | 1113 | - |
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obs | - | - | 96.45 % |
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精密化 TLS | S11: 0.0749 Å ° / 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 3.0411 | 0.1905 | -0.7111 | 3.2294 | -1.0981 | 3.4504 | 0.3821 | 0.0167 | -0.3922 | -0.1149 | -0.1057 | 0.3283 | 0.0512 | 0.04 | -0.1555 | -0.0134 | 0.0326 | -0.1974 | 0.0357 | -0.0179 | 65.695 | 53.965 | 171.04 | 2 | 2.7702 | 0.2561 | 0.2648 | 3.7708 | -0.7848 | 3.6716 | -0.0962 | -0.2153 | 0.0955 | -0.0139 | -0.3827 | 0.573 | 0.3579 | -0.061 | -0.0596 | 0.0091 | -0.006 | -0.284 | 0.0451 | 0.0721 | 68.046 | 43.202 | 194.621 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Label asym-ID | Auth seq-ID | Label seq-ID |
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1 | X-RAY DIFFRACTION | 1 | AA34 - 215 | 34 - 215 | 2 | X-RAY DIFFRACTION | 2 | BB34 - 215 | 34 - 215 | | | | |
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