解像度: 1.84→19.47 Å / Cor.coef. Fo:Fc: 0.963 / SU B: 5.686 / SU ML: 0.078 / TLS residual ADP flag: LIKELY RESIDUAL / ESU R: 0.132 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Rwork
0.19275
-
-
obs
0.19275
49338
99.35 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 30.417 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.23 Å2
0 Å2
-0.13 Å2
2-
-
0.49 Å2
0 Å2
3-
-
-
-0.27 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.84→19.47 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3962
0
31
335
4328
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.009
0.022
4147
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
2928
X-RAY DIFFRACTION
r_angle_refined_deg
1.175
1.975
5608
X-RAY DIFFRACTION
r_angle_other_deg
0.837
3
7081
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.368
5
502
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
34.674
23.529
204
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.59
15
716
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
12.681
15
33
X-RAY DIFFRACTION
r_chiral_restr
0.065
0.2
585
X-RAY DIFFRACTION
r_gen_planes_refined
0.004
0.02
4629
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
900
X-RAY DIFFRACTION
r_nbd_refined
0.204
0.2
787
X-RAY DIFFRACTION
r_nbd_other
0.179
0.2
2888
X-RAY DIFFRACTION
r_nbtor_refined
0.18
0.2
2007
X-RAY DIFFRACTION
r_nbtor_other
0.083
0.2
2116
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.154
0.2
293
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
0.034
0.2
2
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.119
0.2
15
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.187
0.2
58
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.164
0.2
18
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.368
2
3261
X-RAY DIFFRACTION
r_mcbond_other
0.173
2
1011
X-RAY DIFFRACTION
r_mcangle_it
1.7
4
3986
X-RAY DIFFRACTION
r_scbond_it
3.261
6
1981
X-RAY DIFFRACTION
r_scangle_it
4.32
8
1622
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.84→1.887 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rwork
0.244
3604
-
Rfree
-
0
-
obs
-
-
98.52 %
精密化 TLS
手法: refined / Origin x: -13.784 Å / Origin y: -20.815 Å / Origin z: 22.332 Å