Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SOLEIL BEAMLINE PROXIMA 1 |
Synchrotron site | SOLEIL |
Beamline | PROXIMA 1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2021-06-13 |
Detector | DECTRIS EIGER X 9M |
Wavelength(s) | 0.91956 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 21.764, 38.411, 87.743 |
Unit cell angles | 90.00, 91.23, 90.00 |
Refinement procedure
Resolution | 19.660 - 1.897 |
R-factor | 0.2099 |
Rwork | 0.207 |
R-free | 0.24990 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 0.960 |
Data reduction software | autoPROC |
Data scaling software | Aimless (0.7.7) |
Phasing software | PHASER |
Refinement software | BUSTER (2.10.4) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 19.661 | 5.422 | 2.000 |
High resolution limit [Å] | 1.897 | 4.307 | 1.897 |
Rmerge | 0.260 | 0.107 | 1.336 |
Rmeas | 0.279 | 0.114 | 0.108 |
Rpim | 0.101 | 0.040 | 0.566 |
Total number of observations | 77793 | ||
Number of reflections | 10239 | 512 | 512 |
<I/σ(I)> | 5.55 | 12.63 | 12.54 |
Completeness [%] | 91.2 | 100 | 30.3 |
Completeness (spherical) [%] | 87.8 | ||
Completeness (ellipsoidal) [%] | 91.2 | ||
Redundancy | 7.6 | 7.84 | 7.18 |
CC(1/2) | 0.985 | 0.993 | 0.483 |
Anomalous completeness (spherical) | 87.4 | ||
Anomalous completeness | 90.9 | ||
Anomalous redundancy | 4.0 | ||
CC(ano) | -0.220 | ||
|DANO|/σ(DANO) | 0.7 |
Diffraction limits | Principal axes of ellipsoid fitted to diffraction cut-off surface |
1.800 Å | 0.981, 0.981, 0.981 |
1.977 Å | 0.000, 0.000, 0.000 |
1.937 Å | -0.192, -0.192, -0.192 |
Criteria used in determination of diffraction limits | local <I/sigmaI> ≥ 1.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 292 | AS, Tris-HCL, NaB |