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9RR3

Galectin-3 with a bound inhibitor

This is a non-PDB format compatible entry.
Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsESRF BEAMLINE ID23-1
Synchrotron siteESRF
BeamlineID23-1
Temperature [K]100
Detector technologyPIXEL
Collection date2023-11-01
DetectorDECTRIS EIGER2 X CdTe 16M
Wavelength(s)0.886
Spacegroup nameP 21 21 21
Unit cell lengths34.425, 57.474, 61.225
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution22.060 - 1.351
R-factor0.1805
Rwork0.180
R-free0.19420
Structure solution methodMOLECULAR REPLACEMENT
RMSD bond length0.011
RMSD bond angle1.150
Data reduction softwareautoPROC
Data scaling softwareAimless (0.7.15)
Phasing softwarePHASER
Refinement softwareBUSTER (2.11.8)
Data quality characteristics
 OverallInner shellOuter shell
Low resolution limit [Å]29.53329.5331.374
High resolution limit [Å]1.3513.7791.351
Rmerge0.0900.0720.294
Rmeas0.0980.0790.319
Rpim0.0380.0300.123
Total number of observations18008487158859
Number of reflections2733913671367
<I/σ(I)>11.9419.024.33
Completeness [%]99.910098.4
Completeness (spherical) [%]99.9100.098.4
Completeness (ellipsoidal) [%]99.9100.098.4
Redundancy6.596.386.48
CC(1/2)0.9940.9950.966
Anomalous completeness (spherical)99.699.796.3
Anomalous completeness99.699.796.3
Anomalous redundancy3.53.83.5
CC(ano)-0.059-0.082-0.194
|DANO|/σ(DANO)0.70.60.6
Diffraction limitsPrincipal axes of ellipsoid fitted to diffraction cut-off surface
1.298 Å1.000, 1.000, 1.000
1.255 Å0.000, 0.000, 0.000
1.267 Å0.000, 0.000, 0.000
Criteria used in determination of diffraction limitslocal <I/sigmaI> ≥ 1.2
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP293Index A4: 0.1M BIS-TRIS pH 6.5, 2.0M Ammonium sulfate

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