Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2023-02-01 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 1.0 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 67.820, 100.210, 103.970 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 72.150 - 1.618 |
R-factor | 0.19358 |
Rwork | 0.192 |
R-free | 0.22374 |
Structure solution method | MOLECULAR REPLACEMENT |
Data reduction software | autoPROC |
Data scaling software | autoPROC |
Phasing software | PHASER |
Refinement software | REFMAC (5.8.0405) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 72.152 | 1.812 |
High resolution limit [Å] | 1.618 | 1.618 |
Rmerge | 0.157 | 1.750 |
Rpim | 0.045 | 0.509 |
Number of reflections | 62111 | 3107 |
<I/σ(I)> | 13.1 | 1.9 |
Completeness [%] | 95.0 | |
Redundancy | 13.3 | |
CC(1/2) | 1.000 | 0.591 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 30mM sodium nitrate, 30mM disodium hydrogen phosphate, 30mM ammonium sulfate, 100mM MES-imidazole pH 6.5, 20%(w/v) PEG 550 MME, 10%(w/v) PEG 20K (Morpheus condition C1) |