Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2023-06-02 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 1.00 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 67.870, 99.900, 104.080 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 72.070 - 1.630 |
R-factor | 0.214 |
Rwork | 0.211 |
R-free | 0.26200 |
Structure solution method | MOLECULAR REPLACEMENT |
Data reduction software | autoPROC |
Data scaling software | autoPROC |
Phasing software | PHASER |
Refinement software | REFMAC (v5.8) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 72.072 | 1.797 |
High resolution limit [Å] | 1.630 | 1.630 |
Rmerge | 0.240 | 1.588 |
Rpim | 0.067 | 0.542 |
Number of reflections | 60295 | 3015 |
<I/σ(I)> | 13.8 | 1.8 |
Completeness [%] | 93.9 | |
Redundancy | 13 | |
CC(1/2) | 1.000 | 0.443 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 30mM sodium nitrate, 30mM disodium hydrogen phosphate, 30mM ammonium sulfate, 100mM MES-imidazole pH 6.5, 20%(w/v) PEG 550 MME, 10%(w/v) PEG 20K (Morpheus condition C1) |