9PU2
Crystal structure of EEEV-179 Fab (Crystal Kappa)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 21-ID-F |
| Synchrotron site | APS |
| Beamline | 21-ID-F |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2022-12-16 |
| Detector | DECTRIS EIGER X 9M |
| Wavelength(s) | 0.97872 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 79.859, 73.106, 95.887 |
| Unit cell angles | 90.00, 95.31, 90.00 |
Refinement procedure
| Resolution | 48.240 - 2.250 |
| R-factor | 0.19068 |
| Rwork | 0.188 |
| R-free | 0.24471 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.008 |
| RMSD bond angle | 1.574 |
| Data reduction software | HKL-3000 |
| Data scaling software | HKL-3000 |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.8.0352) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.290 |
| High resolution limit [Å] | 2.250 | 2.250 |
| Number of reflections | 25428 | 1166 |
| <I/σ(I)> | 11.6 | 2.5 |
| Completeness [%] | 97.2 | 91.6 |
| Redundancy | 3.5 | 3.2 |
| CC(1/2) | 0.982 | 0.837 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.3 M sodium fluoride, 15% PEG3350 |
