Experimental procedure
| Experimental method | SINGLE WAVELENGTH | 
| Source type | SYNCHROTRON | 
| Source details | NSLS-II BEAMLINE 17-ID-2 | 
| Synchrotron site | NSLS-II | 
| Beamline | 17-ID-2 | 
| Temperature [K] | 100 | 
| Detector technology | PIXEL | 
| Collection date | 2025-03-25 | 
| Detector | DECTRIS EIGER X 16M | 
| Wavelength(s) | 0.979338 | 
| Spacegroup name | I 2 3 | 
| Unit cell lengths | 143.940, 143.940, 143.940 | 
| Unit cell angles | 90.00, 90.00, 90.00 | 
Refinement procedure
| Resolution | 50.890 - 2.750 | 
| R-factor | 0.2113 | 
| Rwork | 0.209 | 
| R-free | 0.25450 | 
| Structure solution method | MOLECULAR REPLACEMENT | 
| RMSD bond length | 0.005 | 
| RMSD bond angle | 0.725 | 
| Data reduction software | XDS (BUILT 20241002) | 
| Data scaling software | Aimless (0.7.15) | 
| Phasing software | PHASER (2.8.3) | 
| Refinement software | PHENIX (1.21.2_5419) | 
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 58.763 | 2.794 | 
| High resolution limit [Å] | 2.747 | 2.747 | 
| Rmerge | 0.167 | 0.976 | 
| Rmeas | 0.188 | 1.097 | 
| Rpim | 0.086 | 0.496 | 
| Number of reflections | 13064 | 656 | 
| <I/σ(I)> | 5.9 | |
| Completeness [%] | 99.7 | |
| Redundancy | 4.7 | |
| CC(1/2) | 0.990 | 0.388 | 
Crystallization Conditions
| crystal ID | method | pH | temperature | details | 
| 1 | VAPOR DIFFUSION, HANGING DROP | 6.5 | 298 | 0.1 M MES, 1 M sodium citrate, 5 mM TCEP | 






