9NUA
Crystal structure of NP207 TCR
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 19-ID |
| Synchrotron site | NSLS-II |
| Beamline | 19-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-05-17 |
| Detector | DECTRIS EIGER2 XE 9M |
| Wavelength(s) | 0.9795 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 62.121, 126.019, 66.628 |
| Unit cell angles | 90.00, 110.23, 90.00 |
Refinement procedure
| Resolution | 30.810 - 2.500 |
| R-factor | 0.2162 |
| Rwork | 0.214 |
| R-free | 0.26280 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.003 |
| RMSD bond angle | 0.547 |
| Data reduction software | HKL-3000 |
| Data scaling software | HKL-3000 |
| Phasing software | HKL-3000 |
| Refinement software | PHENIX (1.21.2_5419) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 30.900 | 2.540 |
| High resolution limit [Å] | 2.500 | 2.500 |
| Rmerge | 0.079 | 0.477 |
| Rmeas | 0.090 | 0.553 |
| Rpim | 0.042 | 0.273 |
| Number of reflections | 32374 | 1329 |
| <I/σ(I)> | 13.6 | 1.32 |
| Completeness [%] | 97.7 | 80.2 |
| Redundancy | 4.3 | 3.6 |
| CC(1/2) | 0.993 | 0.820 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.9 | 289 | 0.2M Potassium Nitrate:HCl, 20% (w/v) PEG 3,350 |
