9NTL
Crystal structure of NP202 TCR
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 19-ID |
| Synchrotron site | NSLS-II |
| Beamline | 19-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-05-17 |
| Detector | DECTRIS EIGER2 XE 9M |
| Wavelength(s) | 0.9795 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 62.072, 127.385, 66.563 |
| Unit cell angles | 90.00, 110.11, 90.00 |
Refinement procedure
| Resolution | 32.600 - 2.560 |
| R-factor | 0.226 |
| Rwork | 0.223 |
| R-free | 0.27380 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.002 |
| RMSD bond angle | 0.564 |
| Data reduction software | HKL-3000 |
| Data scaling software | HKL-3000 |
| Phasing software | HKL-3000 |
| Refinement software | PHENIX ((1.21.2_5419: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 33.000 | 2.620 |
| High resolution limit [Å] | 2.560 | 2.560 |
| Rmerge | 0.144 | 0.850 |
| Rmeas | 0.158 | 0.959 |
| Rpim | 0.063 | 0.430 |
| Number of reflections | 30273 | 1226 |
| <I/σ(I)> | 13.1 | 1.1 |
| Completeness [%] | 97.5 | 81 |
| Redundancy | 5.9 | 4.2 |
| CC(1/2) | 0.992 | 0.590 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.2 | 289 | 0.2M Ammonium nitrate, 20% (w/v) PEG 3,350 |
