9NMW
TCR156 S30Ealpha S32Qalpha bound to HLA A*02:01-PAP
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 8.2.1 |
| Synchrotron site | ALS |
| Beamline | 8.2.1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2024-04-10 |
| Detector | DECTRIS EIGER2 S 9M |
| Wavelength(s) | 1 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 226.008, 46.635, 92.552 |
| Unit cell angles | 90.00, 96.08, 90.00 |
Refinement procedure
| Resolution | 46.020 - 2.110 |
| R-factor | 0.1959 |
| Rwork | 0.194 |
| R-free | 0.23240 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.003 |
| RMSD bond angle | 0.592 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.21.2_5419) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 46.020 | 2.150 |
| High resolution limit [Å] | 2.110 | 2.110 |
| Rmerge | 0.075 | 1.810 |
| Rmeas | 0.089 | 2.135 |
| Rpim | 0.048 | 1.120 |
| Number of reflections | 55203 | 3202 |
| <I/σ(I)> | 10.1 | 0.57 |
| Completeness [%] | 98.7 | 98.52 |
| Redundancy | 3.5 | 3.6 |
| CC(1/2) | 0.998 | 0.350 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 7.5 | 295 | 0.2 M Na2SO4, bis tris propane pH 7.5, 20% PEG 3350 |






