9LEH
nitrile synthetase ArtA
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL10U2 |
| Synchrotron site | SSRF |
| Beamline | BL10U2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-12-25 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.979 |
| Spacegroup name | P 21 21 2 |
| Unit cell lengths | 90.757, 105.035, 85.395 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 66.260 - 1.810 |
| R-factor | 0.1953 |
| Rwork | 0.193 |
| R-free | 0.23400 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.005 |
| RMSD bond angle | 0.782 |
| Data reduction software | autoPX |
| Data scaling software | HKL-3000 |
| Phasing software | PHENIX |
| Refinement software | PHENIX ((1.17.1_3660: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 85.410 | 5.710 |
| High resolution limit [Å] | 1.810 | 1.810 |
| Rmerge | 0.163 | |
| Rmeas | 0.194 | |
| Number of reflections | 75408 | 75408 |
| <I/σ(I)> | 4.3 | |
| Completeness [%] | 99.8 | 99.9 |
| Redundancy | 6.7 | |
| CC(1/2) | 0.985 | 0.985 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293.15 | succinic acid, PEG3350 |






